ROD-L M150AC
All ROD-L hipot testers have adjustable electronically controlled test voltage ramp control and timing circuits. In addition, ROD-L AC and DC hipot testers interconnect to simplify multiple testing requirements. Each are compatible with all ROD-L Ground Continuity and Leakage Current test instruments.
MODEL M150AC
Hipot Test System
IEEE-488 BUS-Compatible Hipot Test System
Safe, Fast Efficient
Fully programmable test parameters
- Digital display
- Resolution of programmable test parameters is 0.5%
- Performs an AC dielectric strength (Hipot) test concurrent with a ground continuity test
- Applies a test potential of up to 5000 VAC at 50 milliamps (user programmable)
- IEEE-488 BUS-compatible – enables data logging during each test, and remote programming of:
- Test voltage
- Test time
- Voltage ramp rate
- Real current trip point
- Total current trip point
- Under current trip point
- Detects and indicates the following events:
- Test ready (security chassis ground sensed)
- Test in progress
- Test passed
- Test failed
- Arcing
- Excessive real (resistive) current
- Excessive total leakage current
- Under current
- Lack of adequate chassis ground
- Performs tests in full compliance with UL, VDE, BSE, IEC, CSA, and other test standards
Superior Safety Features
- Visual and audible alert indicating Hipot test in progress
- Low current security chassis ground circuit (ensures device under test has ground connection of 0.5ohm between chassis and power cord ground pin)
- Fast HV shutdown within 2 milliseconds of HV test automatically on test failure or on command
For specifications, call ROD-L or download the PDF file and refer to page 2.